26 results found for MIL-STD-883, T.M. 2009.
Reference
Title
Source
Type / Subtype
Date
Issue / Rev
Status
This method establishes screening procedures for total lot screening of microelectronics to assist in achieving levels of quality and reliability commensurate with the...
DLA
Method
13 /
Active
This method establishes qualification and quality conformance inspection procedures for microelectronics to assure that the device and lot quality conforms with the...
DLA
Method
17 /
Active
This report provides the compliance matrix between the ECSS-Q-ST-60-13C standard against the Extended Lot Acceptance Test specifically implemented for the evaluation...
Qualification Report
/
Active
DLA
Generic
M / -
Active
MNFR
Detail / Drawing
2018-TS-003 / -
Active
MNFR
Detail / Drawing
2021-TS-004 / -
Active
MNFR
Detail / Drawing
2020-TS-023 / -
Active
MNFR
Detail / Drawing
2020-TS-008 / -
Active
MNFR
Detail / Drawing
2021-TS-008 / -
Active