Servicio Familia 
Authenticity Test for Transistor-Diode Array
ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.
EEE Parts Results Page
Authenticity Test for Transistor-Diode Array
ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.
EEE Parts Results Page
59 results found for Transistor-Diode Array/Signal Acquisition-Conditioning/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
PROTO
Not qualified
NOT LISTED IN QPL
Surface Mount
CFP-16
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-16
JAN B
Not qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
QML H
Not qualified
QPDSIS-38534
Surface Mount
Hybrid PKG-4
SPACE
Not qualified
ADI Space QPL
Through Hole Mount
TO-99
SPACE
Not qualified
ADI Space QPL
Surface Mount
CFP-10
TESTED DIE
Not qualified
NOT LISTED IN QPL
DIE
DIE
SPACE
Not qualified
ADI Space QPL
DIE
DIE
QML V
Not qualified
QPDSIS-38535
Surface Mount
CFP-16
QML V
Qualified
QPDSIS-38535
Surface Mount
CQLCC-20
Part validation activities
Cost & Activity Matrix