Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Authenticity Test for SRAM Memory | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Authenticity Test for SRAM Memory

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Electrical Measurements, real time X-Ray

Radiographic X-Ray Inspection

Resistance To Solvent

Resistance To Solvent the Importance marking testing on EEE Parts

Internal visual inspect

Internal Visual Inspection of Hi-Rel EEE Parts

External visual inspections

What is an External Visual Inspection?

electrical measurements

When and What to do in an Electrical Test

EEE Parts Results Page

Authenticity Test for SRAM Memory

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Digital
      • Memory
        • RAM
          • SRAM

6088 results found for SRAM/RAM/Memory/Digital/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
TID (krads)
SEE (MeV/mg/cm2)
Access Time [Max]
Memory Size
Unit price
Lead time

71024S12TYGI
71024S12TYGI
Renesas Electronics formerly Intersil
MFR DS 71024S

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
SOJ-32
12ns
1M (128K x 8)

5962-9461110HBA
WS512K32-17G1TQ
Mercury Systems Inc
5962-94611

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CQFP-68 (Gull Wing)
17 ns
16M (512K x 32)

5962-8969201ZA
P4C188L-25LMB
Pyramid Semiconductor
5962-89692

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-22
25 ns
64K (16K x 4)

5962-8959823MUA
P4C1023-100L1MB
Pyramid Semiconductor
5962-89598

Compare DCL / BOM Cart
QML M
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CDLCC-32
100 ns
1M (128K x 8)

5962-9461109HTC
WS512K32N-20H1Q
Mercury Systems Inc
5962-94611

Compare DCL / BOM Cart
QML H
Not qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
HIP-66 (With Standoffs)
20 ns
16M (512K x 32)

5962-9461114HTA
WS512K32ND-25H1Q
Mercury Systems Inc
5962-94611

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
HIP-66 (With Standoffs)
25 ns
16M (512K x 32)

5962-8866204NC
P4C1256-45CMB
Pyramid Semiconductor
5962-88662

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-28
45 ns
256K (32K x 8)

84036093A
P4C116-45L28MB
Pyramid Semiconductor
84036

Compare DCL / BOM Cart
883
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-28
45 ns
16K (2K x 8)

86051062A
27LS03/B2A
Rochester
86051

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CQLCC-20
65 ns
64-Bits (16 x 4)

7801502FA
SL54S189/BFA
Lansdale
78015

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CFP-16
50 ns
64-Bits (16 x 4)
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.