Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Authenticity Test for Multiple Diode Arrays | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Authenticity Test for Multiple Diode Arrays

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Electrical Measurements, real time X-Ray

Radiographic X-Ray Inspection

Resistance To Solvent

Resistance To Solvent the Importance marking testing on EEE Parts

Internal visual inspect

Internal Visual Inspection of Hi-Rel EEE Parts

External visual inspections

What is an External Visual Inspection?

electrical measurements

When and What to do in an Electrical Test

EEE Parts Results Page

Authenticity Test for Multiple Diode Arrays

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Discretes
    • Diode
      • Multiple Diode Arrays

36 results found for Multiple Diode Arrays/Diode/Discretes

Reset
Part reference
Quality level / QPL
TOP
Package
TID (krads)
Average Output Rectified Current [Max]
Breakdown Voltage [Min]
Forward Surge Current [Max]
Forward Voltage [Max]
Time for Reverse Recovery [Max]
Unit price
Lead time

JANTX1N6507
1N6507 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns

JANTX1N5772
1N5772 FP-10
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
FP-10
300mA
60V
500mA
1V
20ns

JANTXV1N6508
1N6508 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns

JANTX1N6511
1N6511 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
75V
500mA
1V
10ns

JANTXV1N6101
1N6101 DIL-16
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-16
300mA
75V
500mA
1V
10ns

JAN1N6510
1N6510 FP-16
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
FP-16
300mA
75V
500mA
1V
10ns

JAN1N6506
1N6506 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JAN
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns

JANTX1N6101
1N6101 DIL-16
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-16
300mA
75V
500mA
1V
10ns

JANTXV1N6100
1N6100 FP-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTXV
Qualified
QPDSIS-19500
-55ºC to +150ºC
Surface Mount
FP-14
300mA
75V
500mA
1V
10ns

JANTX1N6506
1N6506 DIL-14
Microsemi a Microchip Company
MIL-PRF-19500/474

Compare DCL / BOM Cart
JANTX
Qualified
QPDSIS-19500
-55ºC to +150ºC
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.