


Authenticity Test for Multiple Diode Arrays
ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.
EEE Parts Results Page
Authenticity Test for Multiple Diode Arrays
ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.
EEE Parts Results Page
36 results found for Multiple Diode Arrays/Diode/Discretes
Part reference
Quality level / QPL
Package
TID (krads)
Average Output Rectified Current [Max]
Breakdown Voltage [Min]
Forward Surge Current [Max]
Forward Voltage [Max]
Time for Reverse Recovery [Max]
Unit price
Lead time
JANTX
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns
JANTX
Qualified
QPDSIS-19500
Surface Mount
FP-10
300mA
60V
500mA
1V
20ns
JANTXV
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns
JANTX
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14
300mA
75V
500mA
1V
10ns
JANTXV
Qualified
QPDSIS-19500
Through Hole Mount
DIL-16
300mA
75V
500mA
1V
10ns
JAN
Qualified
QPDSIS-19500
Surface Mount
FP-16
300mA
75V
500mA
1V
10ns
JAN
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14
300mA
60V
500mA
1V
20ns
JANTX
Qualified
QPDSIS-19500
Through Hole Mount
DIL-16
300mA
75V
500mA
1V
10ns
JANTXV
Qualified
QPDSIS-19500
Surface Mount
FP-14
300mA
75V
500mA
1V
10ns
JANTX
Qualified
QPDSIS-19500
Through Hole Mount
DIL-14