Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Authenticity Test for Miscellaneous ICs | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Authenticity Test for Miscellaneous ICs

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Electrical Measurements, real time X-Ray

Radiographic X-Ray Inspection

Resistance To Solvent

Resistance To Solvent the Importance marking testing on EEE Parts

Internal visual inspect

Internal Visual Inspection of Hi-Rel EEE Parts

External visual inspections

What is an External Visual Inspection?

electrical measurements

When and What to do in an Electrical Test

EEE Parts Results Page

Authenticity Test for Miscellaneous ICs

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Miscellaneous Microcircuits

54 results found for Miscellaneous Microcircuits/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
TID (krads)
SEE (MeV/mg/cm2)
Unit price
Lead time

V62/10616-01XE
UC2909MDWREP
Texas Instruments
V62/10616

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
SOIC-20

5962-0252201EXA
2002
Satcon Electronics
5962-02522

Compare DCL / BOM Cart
QML E
Not qualified
QPDSIS-38534
Not Available
Hybrid PKG-14

5962R1621601HXA
SVCL285R5S/H+-E
VPT Inc
5962-16216

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
Hybrid DIP-9
TID (HDR): 100.0
TID (LDR): 100.0
SEGR (Let): 85.0
SEL (Let): 85.0
SEU (Let): 85.0

5962-0254001EXA
2003
Satcon Electronics
5962-02540

Compare DCL / BOM Cart
QML E
Not qualified
QPDSIS-38534
Not Available
Hybrid PKG-10

5962-1721901VXC
LX7730MFQ-V
Microsemi SoC a Microchip Company
5962-17219

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +150ºC
Surface Mount
CQFP-132
TID (HDR): 100.0
TID (LDR): 50.0
SEL (Let): 87.0

V62/12616-01XE
AD5292SRUZ-20-EP
Analog Devices
V62/12616

Compare DCL / BOM Cart
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
TSSOP-14

5962-1422101KXC
RHD5961-201-1S
Frontgrade Technologies Inc
5962-14221

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
TO-276AA (SMD.5)
SEL (Let): 100.0

5962H1422102KXA
RHD5962-901-2S
Frontgrade Technologies Inc
5962-14221

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
TO-276AA (SMD.5)
TID (HDR): 1000.0
SEL (Let): 100.0

5962H1422101KXA
RHD5961-901-2S
Frontgrade Technologies Inc
5962-14221

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
TO-276AA (SMD.5)
TID (HDR): 1000.0
SEL (Let): 100.0

5962R1621602KXC
SVCL2811S/K
VPT Inc
5962-16216

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
Hybrid DIP-9
TID (HDR): 100.0
TID (LDR): 100.0
SEGR (Let): 85.0
SEL (Let): 85.0
SEU (Let): 85.0
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.