Servicio Familia 
Authenticity Test for Jumper Resistors
ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.
EEE Parts Results Page
Authenticity Test for Jumper Resistors
ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.
EEE Parts Results Page
432 results found for Jumper/Resistors
Part reference
Quality level / QPL
Package
Power Rating
Resistance [Nom]
Temperature Coefficient of Resistance
Tolerance
Unit price
Lead time
LEVEL T
Qualified
QPDSIS-32159
Surface Mount
Chip
0402 (1005 Metric)
40mW
0R
Not Available
0,03R
LEVEL C
Qualified
QPDSIS-32159
Surface Mount
Chip
2512 (6432 Metric)
1W
0R
Not Available
0,025R
LEVEL C
Qualified
QPDSIS-32159
Surface Mount
Chip
2010 (5025 Metric)
800mW
0R
Not Available
0,025R
LEVEL M
Qualified
QPDSIS-32159
Surface Mount
Chip
1010 (2525 Metric)
500mW
0R
Not Available
0,02R
LEVEL M
Qualified
QPDSIS-32159
Surface Mount
Chip
0402 (1005 Metric)
40mW
0R
Not Available
0,03R
LEVEL C
Not qualified
QPDSIS-32159
Surface Mount
Chip
2208 (5720 Metric)
225mW
0R
Not Available
0,175R
LEVEL C
Qualified
QPDSIS-32159
Surface Mount
Chip
2010 (5025 Metric)
800mW
0R
Not Available
0,04R
LEVEL C
Qualified
QPDSIS-32159
Surface Mount
Chip
0502 (1406 Metric)
50mW
0R
Not Available
0,06R
LEVEL C
Qualified
QPDSIS-32159
Surface Mount
Chip
2512 (6432 Metric)
1W
0R
Not Available
0,025R
LEVEL T
Qualified
QPDSIS-32159
Surface Mount
Chip
0603 (1608 Metric)