Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Authenticity Test for HEMT RF Transistors | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Authenticity Test for HEMT RF Transistors

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Electrical Measurements, real time X-Ray

Radiographic X-Ray Inspection

Resistance To Solvent

Resistance To Solvent the Importance marking testing on EEE Parts

Internal visual inspect

Internal Visual Inspection of Hi-Rel EEE Parts

External visual inspections

What is an External Visual Inspection?

electrical measurements

When and What to do in an Electrical Test

EEE Parts Results Page

Authenticity Test for HEMT RF Transistors

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Discretes
    • Transistor
      • RF-Microwave Transistor
        • FET RF
          • HEMT RF

26 results found for HEMT RF/FET RF/RF-Microwave Transistor/Transistor/Discretes

Reset
Part reference
Quality level / QPL
TOP
Package
Unit price
Lead time

561300401C
CFY67 MICRO-X
Infineon
ESCC 5613/004

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-65ºC to +150ºC
Surface Mount
MICRO-X

561300404
CFY67 MICRO-X
Infineon
ESCC 5613/004

Compare DCL / BOM Cart
ESCC
Not qualified
ESCC QPL
-65ºC to +150ºC
Surface Mount
MICRO-X

561300402C
CFY67 MICRO-X
Infineon
ESCC 5613/004

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-65ºC to +150ºC
Surface Mount
MICRO-X

561400903
CHKA012bSYA
United Monolithic Semiconductors
ESCC 5614/009

Compare DCL / BOM Cart
ESCC
Qualified
ESCC QPL
-40ºC to +85ºC
Surface Mount
CerMetalFlanged-4

561400602C
CLY32 MWP25
Infineon
ESCC 5614/006

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-65ºC to +175ºC
Surface Mount
MWP25

561300404C
CFY67 MICRO-X
Infineon
ESCC 5613/004

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-65ºC to +150ºC
Surface Mount
MICRO-X

561300204C
CFY66 MICRO-X
Infineon
ESCC 5613/002

Compare DCL / BOM Cart
ESCC C
Not qualified
ESCC QPL
-65ºC to +150ºC
Surface Mount
MICRO-X

561400901
CHK8101-SYC
United Monolithic Semiconductors
ESCC 5614/009

Compare DCL / BOM Cart
ESCC
Qualified
ESCC QPL
-40ºC to +85ºC
Surface Mount
CerMetalFlanged-2

561300401
CFY67 MICRO-X
Infineon
ESCC 5613/004

Compare DCL / BOM Cart
ESCC
Not qualified
ESCC QPL
-65ºC to +150ºC
Surface Mount
MICRO-X

561300202
CFY66 MICRO-X
Infineon
ESCC 5613/002

Compare DCL / BOM Cart
ESCC
Not qualified
ESCC QPL
-65ºC to +150ºC
Surface Mount
MICRO-X
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.