Servicio Familia 
Authenticity Test for DRAM Memory
ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.
EEE Parts Results Page
Authenticity Test for DRAM Memory
ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.
EEE Parts Results Page
228 results found for DRAM/RAM/Memory/Digital/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Access Time [Max]
Memory Size
Unit price
Lead time
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-28
100 ns
16M (4M x 4)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
ZIP-24
70 ns
16M (4M x 4)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-20
120 ns
4M (1M x 4)
QML Q
Qualified
QPDSIS-38535
Surface Mount
CDLCC-20
100 ns
4M (1M x 4)
QML Q
Qualified
QPDSIS-38535
Surface Mount
CDCC-28 (J-Lead)
30 ns
1M (256K x 4)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-18
120 ns
4M (4M x 1)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-20
100 ns
4M (1M x 4)
CLASS K EQ
Not qualified
NOT LISTED IN QPL
Surface Mount
CQFP-132
TID (HDR): 100.0
SEL (Let): 85.0
6 ns
1G (8M x 32 x 4)
QML Q+
Not qualified
QPDSIS-38535
Surface Mount
CQFP-128 (Gull Wing)
TID (HDR): 50.0
SEL (Let): 111.0
SEU (Let): 1.0
7,5 ns
3G (16M x 48 x 4)
CLASS K EQ
Not qualified
NOT LISTED IN QPL
Surface Mount
CFP-72
TID (HDR): 100.0
SEL (Let): 85.0
6 ns
256M (16M x 4 x 4)
Part validation activities
Cost & Activity Matrix