Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Additional Services
    • Industry 4.0 Cybersecurity (IEC 62443) NEW
    • Penetration Test NEW
    • Cybersecurity Certified (CSC) NEW
    • Code Score Matrix NEW
    • Long-term storage of wafers
    • Electronic Design
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • esa-stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Authenticity Test for DA Converters | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Authenticity Test for DA Converters

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

Related content

Electrical Measurements, real time X-Ray

Radiographic X-Ray Inspection

Resistance To Solvent

Resistance To Solvent the Importance marking testing on EEE Parts

Internal visual inspect

Internal Visual Inspection of Hi-Rel EEE Parts

External visual inspections

What is an External Visual Inspection?

electrical measurements

When and What to do in an Electrical Test

EEE Parts Results Page

Authenticity Test for DA Converters

ALTER Authenticity Test Lab provides a complete process of the technical management of the supply chain, from supplier selection and monitoring to inspections and testing techniques aimed at preventing and detecting counterfeit electronic parts entering the manufacturing line. ALTER is in progress of ISO/IEC 17025 accreditation and provides full in-house component testing capabilities.

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Signal Acquisition-Conditioning
      • Data Converter
        • Digital to Analog Converters

402 results found for Digital to Analog Converters/Data Converter/Signal Acquisition-Conditioning/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
Unit price
Lead time

DAC121S101QCMK/NOPB
DAC121S101QCMK/NOPB
Texas Instruments
MFR DS SNAS265

Compare DCL / BOM Cart
AEC-Q
Qualified
AEC-Q100
GOLD
-40ºC to +125ºC
Surface Mount
SOT-23-6

MAX542AESD+
MAX542AESD+
Maxim
MFR DS MAX541/MAX542

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-55ºC to +125ºC
Surface Mount
SOIC-14

LTC1667IG#TRPBF
LTC1667IG#TRPBF
Linear Technology
MFR DS LTC1666/1667/1668

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
SSOP-28

MAX521BEWG+
MAX521BEWG+
Maxim
MFR DS MAX520/521

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
SOIC-24

DAC5675AIPHP
DAC5675AIPHP
Texas Instruments
MFR DS SBAS334

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
HTQFP-48

MX7545GUQ/883B
MX7545GUQ/883B
Maxim
MFR DS MX7545_883B

Compare DCL / BOM Cart
883
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Through Hole Mount
CDIP-20

MAX543AMJA/883B
MAX543AMJA/883B
Maxim
MFR DS MAX543_883B

Compare DCL / BOM Cart
883
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Through Hole Mount
CDIP-8

MX7545SQ/883B
MX7545SQ/883B
Maxim
MFR DS MX7545_883B

Compare DCL / BOM Cart
883
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Through Hole Mount
CDIP-20

MX7533TE/883B
MX7533TE/883B
Maxim
MFR DS MX7533_883B

Compare DCL / BOM Cart
883
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQLCC-20

5962-1522101VZF
EV10DS130AMGC-V
Teledyne e2v Semiconductors
5962-15221

Compare DCL / BOM Cart
QML V
Qualified
QPDSIS-38535
-55ºC to +125ºC
Surface Mount
CCGA-255
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2025 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.