TD

TR003 Total ionization ISL70227SEH, ISL70227SRH

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Parts were tested at low and high dose rates under biased and unbiased conditions at 0.01rad(Si)s and 50rad(Si)/s, respectively. The LDR tests were run to 150krad(Si) the HDR tests were run to 100krad(Si). We observed failures at 100krad(Si) under bias (all four samples) and after 150krad(Si) grounded (also all four samples).
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