General data
Parts were tested at LDR and HDR under biased and unbiased conditions. HDR testing is complete through 150krad(Si) and subsequent high temperature biased anneal. The LDR tests have completed 75krad(Si) and are being continued to 100krad(Si) and through anneal. All samples showed excellent stability over irradiation and anneal, with no observed LDR sensitivity (or HDR sensitivity, for that matter). It should be noted that the SMD pre-irradiation and post-irradiation limits are identical.
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