R34ET0002EU0100 Total ionization ISL72814SEH, ISL73814SEH
General data
Both irradiations were followed by a 168-hour anneal at +100°C under bias. All tested SMD parameters passed at all downpoints. No dose rate, bias, or anneal sensitivity was observed. However, the 150krad(Si) value is well below the 100nA limit and it returns to normal after the anneal.
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