MIL-STD-750, Method 3051 Transistor Electrical Test Methods for semiconductor Devices Part 3: Test Method Safe operating area (continuous dc)
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The purpose of this test is to verify the boundary of the Safe Operating Area (SOA) of a transistor as constituted by the interdependency of the specified voltage, current, power, and temperature in a temperature stable circuit.
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MIL-STD-750, Method 3051
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