MIL-STD-750, Method 3131 Transistor Electrical Test Methods for semiconductor Devices Part 3: Steady state thermal impedance and transient thermal impedance testing of transistors (delta base – emitter voltage method)
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The purpose of this test is to determine the thermal performance of transistor devices. This can be done in two ways, steady-state thermal impedance or thermal transient testing.
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MIL-STD-750, Method 3131
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