MIL-STD-750, Method 3320 Transistor Electrical Test Methods for semiconductor Devices Part 3: Radio frequency (RF) power output, RF power gain, and collector efficiency
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The purpose of this test is to measure the RF power output, RF power gain, and collector efficiency of a transistor under actual operating conditions in a specific RF amplifier test circuit.
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MIL-STD-750, Method 3320
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