MIL-STD-750, Method 3404 Transistor Electrical Test Methods for semiconductor Devices Part 3: MOSFET threshold voltage
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The purpose of this test establishes the means for measuring MOSFET threshold voltage. This method applies to both enhancement-mode and depletion-mode MOSFETs, and for both silicon-on-sapphire and bulk-silicon MOSFETs. It is for use primarily in evaluating the response of MOSFETs to ionizing radiation, and for this reason the test differs from conventional methods for measuring threshold voltage.
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MIL-STD-750, Method 3404
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