MIL-STD-750, Method 5001 High Reliability Space Application Test Methods for Semiconductor Devices Part 5: Wafer lot acceptance testing
General data
These procedures and criteria shall address probe testing and lot acceptance testing, element evaluation or equivalent for each wafer, or wafer lot as applicable unless otherwise approved by the qualifying activity.
2 / w/Change1
Active
10/08/2018 0:00:00
0 pages
Document history
Reference
Issue
MIL-STD-750, Method 5001
2
Document preview
Previous
{{docCtrl.currentPage}} of {{docCtrl.totalPages}} Pages
Next