MIL-STD-750, Method 5002 High Reliability Space Application Test Methods for Semiconductor Devices Part 5: Capacitance voltage measurements to determine oxide quality
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The purpose of this test method is to determine the quality of an oxide layer as indicated by capacitance-voltage (C/V) measurements of a metal-oxide semiconductor capacitor.
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10/08/2018 0:00:00
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MIL-STD-750, Method 5002
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