MIL-STD-750, Method 1001 Environmental Test Methods for Semiconductor Devices Part 1: Test Method Barometric pressure (reduced)
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The purpose of this test method is to check the semiconductor device capabilities under conditions simulating the low pressure encountered in the nonpressurized portions of aircraft in high altitude flight.
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MIL-STD-750, Method 1001
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MIL-STD-750, Method 1001
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