MIL-STD-750, Method 1020 Environmental Test Methods for Semiconductor Devices Part 1: Electrostatic discharge sensitivity (ESD) classification
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This test method establishes the procedure for classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to electrostatic discharge (ESD).
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MIL-STD-750, Method 1020
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MIL-STD-750, Method 1020
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