MIL-STD-883, Method 3014 Electrical Test Method Standard for Microcircuits: unctional testing

This method establishes the means for assuring circuit performance in regard to the test requirements necessary to verify the specified function and to assure that all logic element paths are not open, stuck-at-HIGH level or stuck- at-LOW LEVEL. This method applies to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.