MIL-STD-883, Method 3011 Electrical Test Method Standard for Microcircuits: Output short circuit current
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This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to output short circuit current (IOS). This method applied to digital microelectronic devices, such as TTL, DTL, RTL, and MOS.
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MIL-STD-883, Method 3011
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