MIL-STD-883, Method 3013 Electrical Test Method Standard for Microcircuits: Noise margin measurements for digital microelectronic devices

This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to HIGH level input load which may be specified as a maximum value (IIH max) or a minimum value (IIH min). This method applies to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.