MIL-STD-883, Method 3009 Electrical Test Method Standard for Microcircuits: Input current, low level

This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to LOW level input load which may be specified as a minimum value (IIL min) or as a maximum value (IIL max). This method applied to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.