MIL-STD-883, Method 3010 Electrical Test Method Standard for Microcircuits: Input current, high level
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This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to HIGH level input load which may be specified as a maximum value (IIH max) or a minimum value (IIH min). This method applies to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS.
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MIL-STD-883, Method 3010
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