MIL-STD-883, Method 3020 Electrical Test Method Standard for Microcircuits: High impedance (off-state) low-level output leakage current

This method establishes the means for assuring circuit performance to the limits specified in the applicable acquisition document in regard to output leakage current when an output is in the high-impedance state with a low-level voltage applied. This current should normally be specified as a maximum negative value (IOLZ maximum). This method applies to digital microelectronic devices, such as TTL, DTL, RTL, ECL, and MOS that have tristate outputs.