MIL-STD-883, Method 1008 Environmental Test Method Standard for Microcircuits: Stabilization bake
General data
The purpose of this test is to determine the effect on microelectronic devices of storage at elevated temperatures without electrical stress applied.
2 /
Active
16/09/2019 0:00:00
0 pages
Document history
Reference
Issue
Revision
MIL-STD-883, Method 1008
2
K
Document preview
Previous
{{docCtrl.currentPage}} of {{docCtrl.totalPages}} Pages
Next