MIL-STD-750, Method 2006 Mechanical Test Methods for Semiconductor Devices Part 2: Constant acceleration
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The constant acceleration test is used to determine the effect on semiconductor devices of a centrifugal force.
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04/03/2021 0:00:00
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MIL-STD-750, Method 2006
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MIL-STD-750, Method 2006
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