MIL-STD-750, Method 1038 Environmental Test Methods for Semiconductor Devices Part 1: Burn–in (for diodes, rectifiers, and zeners)

General data

This test is performed to eliminate marginal semiconductor devices or those with defects resulting from manufacturing aberrations that are evidenced as time and stress dependent failures.
5 / A w/Change4
Active
15/04/2021 0:00:00
0 pages

Document history

Reference
Issue
Revision
MIL-STD-750, Method 1038
5
A w/Change3
MIL-STD-750, Method 1038
5

Document preview

Previous
{{docCtrl.currentPage}} of {{docCtrl.totalPages}} Pages
Next

Related documents

Related documents