MIL-STD-750, Method 2016 Mechanical Test Methods for Semiconductor Devices Part 2: Shock
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This test method is intended to determine the ability of the semiconductor devices to withstand moderately severe shocks such as would be produced by rough handling, transportation, or field operation.
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04/03/2021 0:00:00
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MIL-STD-750, Method 2016
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MIL-STD-750, Method 2016
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