MIL-STD-883, Method 2032 Mechanical Test Method Standard for Microcircuits: Visual inspection of passive elements
General data
The purpose of this test is to inspect passive elements used for microelectronic applications, including RF/microwave, for the visual defects described herein.
3 /
Active
16/09/2019 0:00:00
0 pages
Document history
Reference
Issue
Revision
MIL-STD-883, Method 2032
3
K
Document preview
Previous
{{docCtrl.currentPage}} of {{docCtrl.totalPages}} Pages
Next