MIL-STD-883, Method 5006 Electrical Test Method Standard for Microcircuits: Limit testing

This method provides means for establishing or evaluating the maximum capabilities of microelectronic devices, including such capabilities as absolute maximum ratings (from which safe design limits may be derived), maximum stresses which may be applied in screening or testing without causing degradation, and sensitivity to particular screening or testing without causing degradation, and sensitivity to particular screening or testing stresses and the associated modes or mechanisms of failure.