HAST test accelerates humidity reliability checks for electronics, reducing test time while ensuring accurate, representative results.
HAST: Rapid humidity testing for space components
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Testing angular sensors for space applications
Angular sensors tested for space: modular benches enable precise qualification under extreme temperature and vacuum conditions.
Mars 2020 SuperCam Calibration Target (SCCT)
Mars 2020 SuperCam calibration target—key for Mars rover imaging, mineral ID, and instrument health checks.
Angular Sensors | Types and space solution
Angular sensors enable precise position control in space mechanisms, with performance varying by technology and application.
Optical transceiver testing: Electro-optical characterization of 25 GBPS/S
Electro-optical characterization of optical transceivers reveals signal integrity and BER at high-speed data rates.
Lasers Endurance Characterization in Vacuum Conditions
Endurance testing of lasers in vacuum ensures stability, accurate control, and traceability across all wavelengths.
IR Sources Thermal Vacuum Cycling Characterization
Thermal vacuum testing of IR sources under extreme temperatures ensures reliability and accurate characterization.
Thermal Vacuum Testing for space applications
Thermal Vacuum Testing ensures space components withstand extreme cold, heat, and ultra-high vacuum environments.
Advanced Microwave and RF Testing solutions
Microwave testing lab offering expert analysis, design, and inspection for high-reliability microwave systems.
Using a fluorescence microscopy + dye penetrant test on EEE parts
Fluorescence microscopy detects cracks and defects with high sensitivity, enhancing failure analysis in high-reliability electronics.
Microsectioning sample preparation of PCB systems
Microsectioning enables internal inspection of EEE parts, revealing structural defects in PCBs per ESA and industry qualification standards.
Plated Through Via (PTV) manufacturing defects
Plated Through Via (PTV) reliability depends on plating thickness, voids, and cracks; cross-section analysis ensures structural integrity.
NASA reports and evaluates MLCC cracking issues at low voltage
MLCC reliability in space systems is challenged by cracking, often from soldering stress; design and screening help mitigate failures.
The role of the Declared Components List (DCL) in space projects
A DCL tracks all EEE components used in space systems, detailing specs, approvals, and changes for project validation and review.
Parts Approval Document (PAD) in space applications
A parts approval document defines test, quality, and radiation criteria to certify components for use in space or critical applications.
Fundamentals of solderability and testing methods
Solderability refers to how well a surface can be wetted by solder, assessed through visual or force-based test methods.
MIL-STD-883 2003: Solderability Test procedure
MIL-STD-883 defines solderability testing via Dip and Look to assess termination quality after steam aging and solder dipping.
Image Sensors characterization according to the EMVA 1288 standard
Image sensors convert photons into electronic signals, with key parameters like responsivity, SNR, and dark current analyzed.
Lot Acceptance Testing (LAT) for space-qualified components
Lot Acceptance Test (LAT) verifies a component batch’s reliability through screening and endurance tests before final application use.
What does Acceptance Quality Limit (AQL) mean?
Acceptance Quality Limit (AQL) defines the maximum defect rate allowed in a batch based on statistical sampling.