Suitability of advanced acoustic microscopy techniques for screening plastic COTS devices susceptible to experiencing catastrophic failures.
The applicability of this technique in the inspection and failure analysis of systems besides COTS includes PCBs, metallic assemblies, hermetic packages, electronic potting, RF devices, and others.
During this webinar, we discuss how the Sam technique is the best technique for inspecting commercial EEE components for implementation in high-reliability applications. It provides a deep analysis of the devices’ internal structure, integrity, stability, and defect identification.
We also present a study of ALTER Technology carried out in collaboration with the University of Seville, in which we relate SAM results with Electrical Measurement failure. We also talk about the latest projects in the Scanning Acoustic Microscopy Lab.
