


C-SAM for Phase Locked Loop
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Phase Locked Loop
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
60 results found for Phase Locked Loop -PLL-/Frequency Generation/RF-Microwave Microcircuits/Microcircuits
Part reference
Quality level / QPL
Package
Unit price
Lead time
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
QFN-24
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
TQFP-100
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
Surface Mount
CQCC-44 (J-Lead)
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-20
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
CQCC-44 (J-Lead)
MECH SAMPLE
Not qualified
NOT LISTED IN QPL
Surface Mount
CQFP-64
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
VQFN-36
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
VQFN-48
SPACE
Not qualified
NOT LISTED IN QPL
Surface Mount
CQCC-44 (J-Lead)
Part validation activities
Cost & Activity Matrix