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C-SAM for Phase Locked Loop

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

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EEE Parts Results Page

C-SAM for Phase Locked Loop

C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.

EEE Parts Results Page

Applications expected requirements
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  • Microcircuits
    • RF-Microwave Microcircuits
      • Frequency Generation
        • Phase Locked Loop -PLL-

60 results found for Phase Locked Loop -PLL-/Frequency Generation/RF-Microwave Microcircuits/Microcircuits

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Package
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HMC704LP4E
HMC704LP4E
Hittite Microwave Co
MFR DS HMC704LP4E

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
QFN-24

AD9910BSVZ
AD9910BSVZ
Analog Devices
MFR DS AD9910

Compare DCL / BOM Cart
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
TQFP-100

5962-8875701EA
CD54HCT4046AF3A
Texas Instruments
5962-88757

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16

83336-21
PE83336-21
Peregrine Semiconductor
MFR DS PE83336

Compare DCL / BOM Cart
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQCC-44 (J-Lead)

5962-9855001QXA
LMX2315WG/BXA
Rochester
5962-98550

Compare DCL / BOM Cart
QML Q
Qualified
QPDSIS-38535
-55ºC to +105ºC
Surface Mount
CFP-20

9704-01
PE9704-01
Peregrine Semiconductor
MFR DS PE9704 EM

Compare DCL / BOM Cart
EM
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
CQCC-44 (J-Lead)

LMX2615-MKT-MS
LMX2615-MKT-MS
Texas Instruments
MFR DS SNAS739 EM

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MECH SAMPLE
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQFP-64

V62/21613-01XE
LMX2571SHHTEP
Texas Instruments
V62/21613

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EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
VQFN-36

V62/19616-01XE
LMX2694SRTCTEP
Texas Instruments
V62/19616

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EP
Not qualified
NOT LISTED IN QPL
-55ºC to +115ºC
Surface Mount
VQFN-48

9704-11
PE9704-11
Peregrine Semiconductor
MFR DS PE9704

Compare DCL / BOM Cart
SPACE
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
CQCC-44 (J-Lead)
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Alter Technology Laboratory Services
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