Assessing the stability of optoelectronic parameters is nowadays requested by many customers.
Typical pass/fail criteria are not useful, and no actual information is available about optoelectronic parts (mostly COTS) operating in space environments or sometimes in ways that were not designed. A detailed study of the degradation or failure modes may determine that not fully compliant devices may still be suitable for a certain application.
This need is addressed and explained with several real examples tackled by the Optoelectronics laboratory daily.
Topics
- Testing above maximum ratings, surprising results.
- Samples rejection attending to real application requirements.
Juan Moreno Echarri
Juan Moreno has a bachelor’s degree in physics and since 2010 has worked in the Optoelectronics and Innovation department of ALTER. In charge of the BepiColombo/SolO SiC blocking diodes as a test engineer for years. Currently responsible for radiation tolerance improving SiC modules and SiC plastic modules testing. Nowadays, he is the technical contact point for the SiC diodes development in ALTER.
