As commercial off-the-shelf (COTS) optoelectronics rapidly evolve in step with advancements in terrestrial applications, space system engineers face increasingly complex challenges. Higher optical power outputs, novel packaging designs, and tighter integration are redefining the operational landscape—but also pushing traditional space qualification processes to their limits.
Datasheets for these components are often insufficient for space-grade reliability assessments. They typically provide limited information under ideal terrestrial conditions, whereas the harsh and variable space environment demands performance beyond rated maximums. This often necessitates extending test protocols beyond specification limits, introducing nonlinear effects, thermal instability, and failure modes that are not captured in conventional qualification tests.
In this technical webinar, we’ll explore these issues through a series of real-world test cases currently underway. You’ll gain insights into the behavior of next-generation COTS optoelectronics under stress conditions, learn about evolving test methodologies, and understand the implications of leveraging terrestrial innovation in orbital and deep-space missions.
Juan Moreno Echarri
Juan Moreno has a bachelor’s degree in physics and since 2010 has worked in the Optoelectronics and Innovation department of ALTER. In charge of the BepiColombo/SolO SiC blocking diodes as a test engineer for years. Currently responsible for radiation tolerance improving SiC modules and SiC plastic modules testing. Nowadays, he is the technical contact point for the SiC diodes development in ALTER
