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DPA Test for Phase Locked Loop

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed.

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EEE Parts Results Page

DPA Test for Phase Locked Loop

Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed.

EEE Parts Results Page

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62 results found for Phase Locked Loop -PLL-/Frequency Generation/RF-Microwave Microcircuits/Microcircuits

Compare
# Part reference
Unit price
Lead time
Quality level / QPL
TOP
Package
HMC704LP4E
HMC704LP4E
Hittite Microwave Co
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
QFN-24
AD9910BSVZ
AD9910BSVZ
Analog Devices
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
-40ºC to +85ºC
Surface Mount
TQFP-100
LMX2615-MKT-MS
LMX2615-MKT-MS
Texas Instruments
MECH SAMPLE
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQFP-64
83336-21
PE83336-21
Peregrine Semiconductor
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
CQCC-44 (J-Lead)
9704-01
PE9704-01
Peregrine Semiconductor
EM
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
CQCC-44 (J-Lead)
5962-9855001QXA
LMX2315WG/BXA
Rochester
QML Q
Qualified
QPDSIS-38535
-55ºC to +105ºC
Surface Mount
CFP-20
5962-8875701EA
CD54HCT4046AF3A
Texas Instruments
QML Q
Qualified
QPDSIS-38535
-55ºC to +125ºC
Through Hole Mount
CDIP-16
V62/21613-01XE
LMX2571SHHTEP
Texas Instruments
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +125ºC
Surface Mount
VQFN-36
V62/19616-01XE
LMX2694SRTCTEP
Texas Instruments
EP
Not qualified
NOT LISTED IN QPL
-55ºC to +115ºC
Surface Mount
VQFN-48
97042-11
PE97042-11
Peregrine Semiconductor
SPACE
Not qualified
NOT LISTED IN QPL
-40ºC to +85ºC
Surface Mount
CQCC-44 (J-Lead)
Part validation activities
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