


DPA Test for Phase Locked Loop
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed.
EEE Parts Results Page
DPA Test for Phase Locked Loop
Destructive Physical Analysis (DPA test) is a systematic, logical, detailed examination of EEE parts at various stages of physical disassembly. This activity is performed in order to verify that the manufactured lot quality is in accordance with the detailed specification and project requirements. Anomalies and defects detected through DPA could cause degradation or failure of the system in which the devices are to be employed.
EEE Parts Results Page
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62 results found for
Phase Locked Loop -PLL-/Frequency Generation/RF-Microwave Microcircuits/Microcircuits
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# Part reference
Lead time
Quality level / QPL
Package
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
QFN-24
COMMERCIAL
Not qualified
NOT LISTED IN QPL
SILVER
Surface Mount
TQFP-100
MECH SAMPLE
Not qualified
NOT LISTED IN QPL
Surface Mount
CQFP-64
HIGH RELIABILITY
Not qualified
NOT LISTED IN QPL
Surface Mount
CQCC-44 (J-Lead)
EM
Not qualified
NOT LISTED IN QPL
Surface Mount
CQCC-44 (J-Lead)
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-16
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
VQFN-36
EP
Not qualified
NOT LISTED IN QPL
Surface Mount
VQFN-48
SPACE
Not qualified
NOT LISTED IN QPL
Surface Mount
CQCC-44 (J-Lead)
Part validation activities
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