Skip to Content
  • Resources
    • COTS For Space WEBINARS
    • EEE Components
    • SPECIFICATIONS / QPLs
    • Events / Webinars
    • Space Talks
    • Tech Articles
    • Manufacturer Notifications
  • Electronic Design
  • Laboratory Services
    • Laboratory Standard Testing
    • Non Standard Testing
    • Silicon Carbide -SiC- Diodes
    • CrowdTesting
    • Optoelectronics
    • Small Sats
    • Representative Projects / Papers
  • Tools
    • Comparator
    • MYDCLs / BOMs
    • Stockplace
  • About Us
  • Proposal Next
  • Sign In
Cookies on the doEEEt website. We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we'll assume that you are happy to receive all cookies on the doEEEt website. However, if you would like to, you can change your cookie settings at any time. Link to cookies policy.
doEEEt Bond Pull Test for Power Filters ICs | doEEEt.com
  • Home
  • How does doEEEt works
  • About us
  • Contact Us
  • Terms of Use
  • Disclaimer
  • Privacy Policy
  • Privacy Policy and Legal Notice
  • Cookie Policy
  • Copyright
  • autosignup2
  • Instant Quote
  • Introducing NanoXplore And Its European FPGA’s ITAR Free
  • Space Talks 3 - Dan Friedlander
  • autosignup3
  • Shopping Cart
  • wpo
  • Data Protection
  • Components
  • Documents
Please enter at least one character to search
ALTER Laboratory Services
Servicio Familia Servicio Familia
Image
Image

Bond Pull Test for Power Filters ICs

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

Fill the form to receive expert assistance from our skilled engineers and technicians

Read Policy

EEE Parts Results Page

Bond Pull Test for Power Filters ICs

Bond Pull test evaluates bond strength distributions and determines compliance with the specified bond strength requirements of the applicable procurement document. Bond Pull test is applied to the wire-to-die bond, wire-to-substrate bond, or the wire-to-package lead bond inside the package of wire-connected devices bonded by soldering, thermo-compression, ultrasonic, or related techniques. >> Read more

EEE Parts Results Page

Applications expected requirements
Category
Category
Recommended
More...
Close
  • Microcircuits
    • Power Management
      • Filter

194 results found for Filter/Power Management/Microcircuits

Reset
Part reference
Quality level / QPL
TOP
Package
TID (krads)
SEE (MeV/mg/cm2)
DC Resistance [Max]
Input Voltage [Max]
Input Voltage [Min]
Noise Reduction [Min]
Unit price
Lead time

94010H02HXA
SFMC28-461/HH
Interpoint
DWG_94010

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
Hybrid DIP-5
TID (HDR): 1000.0
200mOhm
40V
16V
55dB @f=500kHz

98026-01HZA
AME270461Z/CH
International Rectifier HIREL an Infineon Company
DWG_98026

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-12
400mOhm
400V
-400V
60dB @f=500kHz ; f=1MHz

98026-01HUC
AME270461W/CH
International Rectifier HIREL an Infineon Company
DWG_98026

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Surface Mount
CFP-12
400mOhm
400V
-400V
60dB @f=500kHz ; f=1MHz

95004H03KXC
SFME28-461/KH
Interpoint
DWG_95004

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Point to Point Wiring
Hybrid PKG-12 (Flanged)
TID (HDR): 1000.0
70mOhm
40V
16V
60dB @f=500kHz ; f=1MHz

94010-01HXC
FMC-461/883
Interpoint
DWG_94010

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
Hybrid DIP-5
200mOhm
40V
16V
55dB @f=500kHz

94010H02KXA
SFMC28-461/KH
Interpoint
DWG_94010

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
Hybrid DIP-5
TID (HDR): 1000.0
200mOhm
40V
16V
55dB @f=500kHz

95004H03HUA
SFME28-461V/HH
Interpoint
DWG_95004

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
Hybrid PKG-12 (Flanged, Lead Form Down)
TID (HDR): 1000.0
70mOhm
40V
16V
60dB @f=500kHz ; f=1MHz

95004H03HXC
SFME28-461/HH
Interpoint
DWG_95004

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
-55ºC to +125ºC
Point to Point Wiring
Hybrid PKG-12 (Flanged)
TID (HDR): 1000.0
70mOhm
40V
16V
60dB @f=500kHz ; f=1MHz

96003H02KXC
STF28-461/KH
Interpoint
96003

Compare DCL / BOM Cart
QML K
Qualified
QPDSIS-38534
-55ºC to +125ºC
Through Hole Mount
Hybrid DIP-8
TID (HDR): 1000.0
1200mOhm
50V
12V
50dB @f=0,5kHz ; f=1MHz

91020-01HZX
AFC-461F/CH
International Rectifier HIREL an Infineon Company
91020

Compare DCL / BOM Cart
QML H
Qualified
QPDSIS-38534
Through Hole Mount
Hybrid DIP-5 (Flanged)
Part validation activities
Cost & Activity Matrix
  • <
  • 1
  • 2
  • 3
  • 4
  • 5
  • 6
  • 7
  • 8
  • 9
  • >
Alter Technology Laboratory Services
  • Screening
  • Evaluation/Qualification
  • Scanning Acoustic Microscopy
  • RF/Microwave
  • Incoming Inspection
  • DPA

EEE Components
  • Capacitors
  • Microcircuits
  • Resistors
  • Crystals and Oscillators
  • Schottky Barrier Rectifiers
  • Discretes

Laboratory Success Cases
  • GRACE Project
  • XRAY, SAM and Cross Section
  • SiC schottky Diode
  • JUICE Case
  • Deimos Neptuno
  • Melissa III

Company
  • About Us
  • Contact-us
  • How does doEEEt works?
Security & Privacity
  • Privacy Policy and Legal Notice
  • Copyright
  • Cookie Policy
  • Contact Clause
  • LinkedIn LinkedIn
  • Twitter Twitter
Copyright © 2023 ALTER TECHNOLOGY TÜV NORD S.A.U
All rights reserved.