Servicio Familia 
C-SAM for Phototransistor
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
C-SAM for Phototransistor
C-SAM, also denominated acoustic micro imaging (AMI), and scanning acoustic tomography (SAT) is a consolidated and recognized tool for quality control, inspection, and failure analysis of microelectronic components and materials. Among other types of failures, acoustic techniques are particularly suitable for detecting those irregularities involving materials and density changes, including delaminations, voids, porosity and cracks, in any EEE component.
EEE Parts Results Page
19 results found for Phototransistor/Transistor/Discretes
Part reference
Quality level / QPL
Package
TID (krads)
Unit price
Lead time
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
PILL PACK
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL UNSCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Not Available
Pigtail
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Not Available
PILL PACK
JANS EQ
Not qualified
NOT LISTED IN QPL
Not Available
PILL PACK
HIREL SCREENED
Not qualified
NOT LISTED IN QPL
Not Available
PILL PACK
Part validation activities
Cost & Activity Matrix