


Cross Sectioning for N-channel JFET
The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more
EEE Parts Results Page
Cross Sectioning for N-channel JFET
The cross-sectioning process provides access to the device internal structure, its materials and design. Electronics components are often subjected to cross-sectioning to detect the defects that could not be found using other testing techniques. Cross-sectioning typically involves three discrete steps: mounting the sample in a block of epoxy resin to form the specimen, grinding or cutting the specimen and finally polishing the exposed surface. >> Read more
EEE Parts Results Page
306 results found for N-channel JFET/JFET/FET/Transistor/Discretes
Part reference
Quality level / QPL
Package
Power Dissipation [Max]
TID (krads)
Drain Current [Max]
Drain-Source Voltage [Max]
Unit price
Lead time
JANTXV
Not qualified
QPDSIS-19500
Surface Mount
LCC-4 (UB)
360mW
30mA
40V
JANTXV
Not qualified
QPDSIS-19500
Surface Mount
LCC-4 (UB)
360mW
15mA
40V
JANTX
Not qualified
QPDSIS-19500
Through Hole Mount
TO-206AA (TO-18)
360mW
80mA
40V
JANTX
Not qualified
QPDSIS-19500
Through Hole Mount
TO-206AA (TO-18)
360mW
100mA
30V
JANTX
Not qualified
QPDSIS-19500
Through Hole Mount
TO-71
250mW
8mA
JAN
Qualified
QPDSIS-19500
Surface Mount
LCC-4 (UB)
400mW
80mA
30V
JANTX
Not qualified
QPDSIS-19500
Through Hole Mount
TO-71
250mW
8mA
JANTX
Not qualified
QPDSIS-19500
Surface Mount
LCC-4 (UB)
400mW
80mA
30V
JANTXV
Not qualified
QPDSIS-19500
Surface Mount
LCC-4 (UB)