


Displacement Damage Test for Clock Generation
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
Displacement Damage Test for Clock Generation
Displacement Damage is the result of nuclear interactions, typically scattering, which cause lattice defects. This effect degrades minority carrier lifetime; a typical effect would be gain degradation and leakage current in bipolar transistors. Displacement damage depends on the loss of non-ionizing energy , i.e. energy and momentum transfer to lattice atoms, which depends on the mass and energy of the incident quanta. A simple measure like for ionizing radiation is not possible, so displacement damage must be specified for a specific particle type and energy. >> Read more
EEE Parts Results Page
71 results found for Clock Generation/Clock and Timing/Microcircuits
Part reference
Quality level / QPL
Package
TID (krads)
SEE (MeV/mg/cm2)
Frequency [Max]
Frequency [Min]
Ratio - Input:Output
Unit price
Lead time
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-14
TID (HDR): 500.0
SEL (Let): 120.0
SEU (Let): 80.0
24MHz
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-14
TID (HDR): 300.0
SEL (Let): 120.0
SEU (Let): 80.0
24MHz
QML Q
Qualified
QPDSIS-38535
Surface Mount
CLGA-168
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
750kHz
1:24
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-48
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
6MHz
1:8
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-14
TID (HDR): 500.0
SEL (Let): 120.0
SEU (Let): 80.0
24MHz
QML Q
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
TID (HDR): 500.0
SEL (Let): 120.0
SEU (Let): 80.0
24MHz
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-48
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
6MHz
1:8
QML V
Qualified
QPDSIS-38535
Through Hole Mount
CDIP-14
TID (HDR): 300.0
SEL (Let): 120.0
SEU (Let): 80.0
24MHz
QML V
Qualified
QPDSIS-38535
Surface Mount
CFP-48
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
6MHz
1:8
QML Q
Qualified
QPDSIS-38535
Surface Mount
CFP-48
TID (HDR): 100.0
SEL (Let): 109.0
SEU (Let): 109.0
200MHz
6MHz
1:8
Part validation activities
Cost & Activity Matrix