1032 results found for Ceramic Chip/Ceramic/Capacitors
Part reference
Quality level / QPL
Package
Capacitance [Nom]
Characteristic
DC Rated Voltage
Dielectric Class
Temperature Coefficient of Capacitance
Tolerance
Unit price
Lead time
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,5nF
Type I
100V
0±30ppm/ºC
5%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,3nF
Type I
100V
0±30ppm/ºC
5%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,3nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,6nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,3nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,2nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,6nF
Type I
100V
0±30ppm/ºC
10%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,6nF
Type I
100V
0±30ppm/ºC
10%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,3nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,6nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,2nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,3nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,6nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,2nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,2nF
Type I
100V
0±30ppm/ºC
10%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,2nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,3nF
Type I
100V
0±30ppm/ºC
5%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,2nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,6nF
Type I
100V
0±30ppm/ºC
5%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,5nF
Type I
100V
0±30ppm/ºC
10%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,2nF
Type I
100V
0±30ppm/ºC
1%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,5nF
Type I
100V
0±30ppm/ºC
5%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,5nF
Type I
100V
0±30ppm/ºC
10%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206
1,3nF
Type I
100V
0±30ppm/ºC
10%
FAILURE RATE R
Qualified
QPDSIS-55681
Surface-Mount Device
Chip
1206