MIL-STD-750, Method 2072 Mechanical Test Methods for Semiconductor Devices Part 2: Internal visual transistor (pre–cap) inspection
General data
The purpose of this test method is to verify the construction and workmanship of bipolar transistors, field effect transistors (FET), discrete monolithic, multichip, and multijunction semiconductor devices excluding microwave and selected RF devices.
9 / A w/Change4
Active
04/03/2021 0:00:00
0 pages
Document history
Reference
Issue
Revision
MIL-STD-750, Method 2072
9
A w/Change4
MIL-STD-750, Method 2072
9
Document preview
Previous
{{docCtrl.currentPage}} of {{docCtrl.totalPages}} Pages
Next