MIL-STD-750, Method 2072 Mechanical Test Methods for Semiconductor Devices Part 2: Internal visual transistor (pre–cap) inspection

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The purpose of this test method is to verify the construction and workmanship of bipolar transistors, field effect transistors (FET), discrete monolithic, multichip, and multijunction semiconductor devices excluding microwave and selected RF devices.
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MIL-STD-750, Method 2072
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