MIL-STD-750, Method 1040 Environmental Test Methods for Semiconductor Devices Part 1: Burn–in (for thyristors (controlled rectifiers))
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The purpose of this test method is to eliminate marginal or defective semiconductor devices by operating them at specified screening conditions which reveal electrical failure modes that are time and stress dependent.
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MIL-STD-750, Method 1040
MIL-STD-750, Method 1040
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