MIL-STD-750, Method 1039 Environmental Test Methods for Semiconductor Devices Part 1: Burn–in (for transistors)
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This test is performed to eliminate marginal semiconductor devices or those with defects resulting from manufacturing aberrations that are evidenced as time and stress dependent failures.
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MIL-STD-750, Method 1039
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MIL-STD-750, Method 1039
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