X-ray inspection reveals internal defects in components using non-destructive 2D and 3D imaging techniques.
Radiographic X-Ray Inspection
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XRF tool for advanced material analysis
XRF tool enables fast, non-destructive analysis of materials in aerospace and electronics for compliance and quality control.
C-SAM inspection of stacked capacitor lead frames
C-SAM inspection reveals interface anomalies in horizontally stacked capacitors by using high-frequency acoustic imaging.
Inspection of thick plastic encapsulated parts
Thick plastic encapsulated parts require multi-depth confocal imaging to detect delamination, voids, and internal structural defects.
Reliability challenges in plastic encapsulated microcircuits
Plastic encapsulated parts pose risks like delamination and voids; SAM detects internal flaws non-destructively with high sensitivity.
How to protect your COTS parts during C-SAM inspections
COTS parts undergo safe C-SAM inspection using deionized water, limited immersion, and drying to prevent corrosion and damage.
Why XPS is essential for surface and interface studies
XPS provides precise, non-destructive surface analysis of thin films, revealing elemental composition at nanometer-scale depth.
Coating thickness measurement with X-Ray Fluorescence (XRF)
X-ray fluorescence enables non-destructive measurement of coating thickness with high precision and reliability.
C-SAM crack detection within plastic packages
Scanning Acoustic Microscopy enables reliable crack detection in plastic packages, preventing failures in electronic components.