tin whisker

Tin whisker growth can be delayed but not fully prevented, highlighting the need for strict material controls in high-reliability applications.

Tin whisker growth was detected after prolonged high-temperature and humidity storage, with lengths reaching up to 192μm in some samples.

Tin whisker formation was tested under various conditions, with growth detected after high-temperature and humidity storage cycles.

Tin whisker growth is an unpredictable phenomenon that can cause failures in high-reliability applications, including space systems.