RADECS 2021 – Radiation and its Effects on Components and Systems

Posted by doEEEt Media Group
On January 29, 2021
0

The RADECS conference is the European annual forum on the effects of radiation on electronics and optoelectronics devices and systems where scientists and engineers exchange on the latest signs of progress and results about radiation effects on electronics.

ACTIVES, EEE Components

Radiation Effects on EEPROM Memories

Posted by Manuel Sánchez Ruiz
On November 11, 2020
0

EEPROM devices are especially critical in the design since they are used to upload the instruction to the microprocessors and other configurable devices (boot code of these parts); this is, as configuration memories. Also, they are used to store debugging information, which is key to depurate errors in configurable devices. Any modification of its content because of a bit error (1 to 0 or 0 to 1) due to radiation causes could lead to major consequences.

EEE Components, ENGINEERING AND PROJECT MANAGEMENT SUPPORT

Radiation analysis: What information should be included?

Posted by José Francisco Largaespada
On October 23, 2020
1

The radiation analysis is an essential document for the revision and approval of the components used within space equipment. This document includes in a single place all the information (data, assumptions and methods) and the results obtained when analyzing the radiation effects in the components used.

EEE Components, ENGINEERING AND PROJECT MANAGEMENT SUPPORT

Radiation Sensitive Technologies and EEE Parts

Posted by Juanjo Medina
On September 28, 2020
0

For a better understanding, the information is split into 3 points that represent the different radiation mechanisms which affect an electronic component, giving a brief introduction of each as well as presenting a summary table of technologies and effects.

Tag: SINGLE EVENT EFFECTS

RADECS 2021 – Radiation and its Effects on Components and Systems

Radiation Effects on EEPROM Memories

Radiation analysis: What information should be included?

Radiation Sensitive Technologies and EEE Parts