Radiation effects on electronics include cumulative damage (TID, TNID) and transient failures (SEE), requiring irradiation testing.

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Radiation effects on electronics include cumulative damage (TID, TNID) and transient failures (SEE), requiring irradiation testing.
TID test standards define irradiation methods, dose rates, and handling to assess component tolerance to total ionizing dose.
Radiation affects EEE components in space through TID, displacement damage, and single event effects, impacting mission reliability.
Radiation analysis documents component tolerance to space radiation, ensuring compliance with mission-specific exposure levels.
EEPROM devices in space missions are vulnerable to radiation effects like TID and SEE, impacting data integrity and system reliability.