SiC diodes offer high-performance switching for space use, with radiation effects manageable through proper testing and bias control.
SIC diodes versus Heavy Ions (SEE)
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Electrical characterization of 1.2kV SiC Schottky diode at a wide temperature range
Electrical characterization of SiC diodes shows reliable performance under high temperatures and varying voltage conditions.
ALTER in BepiColombo programme
BepiColombo, a joint ESA-JAXA mission, aims to study Mercury using two orbiters, MPO and MMO, after a seven-year journey.
SiC reliability testing for Bepi Colombo
SiC reliability testing evaluates Schottky diodes for extreme temperatures and radiation, ensuring performance for space missions like BepiColombo.
Testing SiC Schottky Diodes for Heavy Ions Optimization
Testing SiC Schottky diodes under heavy ion radiation evaluates performance, reverse bias limits, and module configurations.
Automotive SiC module technology analysis and radiation testing
Automotive SiC module technology enables higher efficiency in EV inverters, supporting advanced power density and thermal performance.
SiC reliability and defect detection testing
SiC reliability is crucial for high-power applications. Advanced testing methods help detect defects and ensure long-term performance.